During flat panel display (FPD) manufacturing, tests to check the functionality of the panels and tests to evaluate the manufacturing process are performed.
Testing during the array process
In order to test the panel function in the array process, the array test is performed using an array tester, an array probe and a probe unit. This test is designed to test the functionality of TFT array circuits formed for panels on glass substrates and to detect any broken wires or shorts.
At the same time, in order to test the process in the array process to check the success of the process and feedback the previous process, a DC parameter tester, TEG probe and probe unit are used for TEG test. (“TEG” stands for Test Element Group, including TFTs, capacitive elements, wire elements, and other elements of the array circuit.)
Testing in Unit/Module Process
In order to test the panel function in cell process and module process, lighting tests were carried out.
The panel is activated and illuminated to display a test pattern to check panel operation, point defects, line defects, chromaticity, chromatic aberration (non-uniformity), contrast, etc.
There are two inspection methods: operator visual panel inspection and automated panel inspection using a CCD camera that automatically performs defect detection and pass/fail testing.
Cell testers, cell probes and probe units are used for inspection.
The module test also uses a mura detection and compensation system that automatically detects mura or unevenness in the display and eliminates mura with light-controlled compensation.
Post time: Jan-18-2022